DocumentCode :
91906
Title :
Fast S-Transform for Time-Varying Voltage Flicker Analysis
Author :
Wenxuan Yao ; Qiu Tang ; Zhaosheng Teng ; Yunpeng Gao ; He Wen
Author_Institution :
Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, China
Volume :
63
Issue :
1
fYear :
2014
fDate :
Jan. 2014
Firstpage :
72
Lastpage :
79
Abstract :
Voltage flicker analysis is one of the elementary tools of power quality assessment in power systems. A new algorithm, fast S-transform (FST) is proposed and is used to analyze the time-varying voltage flicker in this paper. A voltage flicker waveform envelope, which captures the main flicker characteristic, is obtained by Teager-Kaiser energy operator instantaneously. FST achieves much lower computational complexity in comparison to the S-transform. FST is used to extract both the time and the frequency domain information of each flicker component. The proposed algorithm can be easily implemented with hardware multipliers, making the method a good choice for real-time applications for the time-frequency analysis of flicker. The implementation of the proposed algorithm in the dual-core processor-digital signal processor and advanced RISC machines-based voltage flickermeter is also introduced. The simulation and application results validate the accuracy and efficiency of the proposed algorithm.
Keywords :
coprocessors; digital signal processing chips; power engineering computing; power supply quality; power system measurement; reduced instruction set computing; time-frequency analysis; voltage measurement; voltage multipliers; waveform analysis; FST; Teager-Kaiser energy operator; advanced RISC machine; digital signal processor; dual core processor; fast S-transform; flicker component; frequency domain information extraction; hardware multiplier; power quality assessment; power system; time domain information extraction; time-frequency analysis; time-varying voltage flicker analysis; voltage flicker waveform envelope; voltage flickermeter; Algorithm design and analysis; Frequency modulation; Signal processing algorithms; Time-frequency analysis; Voltage fluctuations; Voltage measurement; Digital signal processor (DSP); S-transform (ST); Teager–Kaiser energy operator (TKEO); flickermeter; time-frequency analysis; voltage flicker;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2013.2277618
Filename :
6584006
Link To Document :
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