Title :
A high-speed, small-area, threshold-voltage-mismatch compensation sense amplifier for gigabit-scale DRAM arrays
Author :
Kawahara, Takayuki ; Sakata, Takeshi ; Itoh, Kiyoo ; Kawajiri, Yoshiki ; Akiba, Takesada ; Kitsukawa, Goro ; Aoki, Masakazu
Author_Institution :
Hitachi Ltd., Tokyo, Japan
fDate :
7/1/1993 12:00:00 AM
Abstract :
A high-speed small-area DRAM sense amplifier with a threshold-voltage (VT) mismatch compensation function is proposed. This sense amplifier features a novel hierarchical data-line architecture with a direct sensing scheme that uses only NMOS transistors in the array, and simple VT mismatch compensation circuitry using a pair of NMOS switching transistors. The layout area of the sense amplifier is reduced to 70% of that of a conventional CMOS common I/O sense amplifier due to the removal of PMOS transistors from the array. The readout time is improved to 35% of that of a conventional CMOS sense amplifier because of direct sensing and a 1/10 reduction in VT mismatch. This sense amplifier eliminates the sensitivity degradation and the area overhead increase that are expected in gigabit-scale DRAM arrays
Keywords :
DRAM chips; MOS integrated circuits; amplifiers; compensation; NMOS transistors; direct sensing scheme; dynamic RAM; gigabit-scale DRAM arrays; hierarchical data-line architecture; high-speed; layout area; memory chips; sense amplifier; threshold-voltage-mismatch compensation; DRAM chips; Degradation; Flip-flops; MOS devices; MOSFETs; Operating systems; Operational amplifiers; Random access memory; Switching circuits; Threshold voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of