• DocumentCode
    919106
  • Title

    A novel SFG structure for C-T high-pass filters

  • Author

    Nielsen, Ivan Riis

  • Author_Institution
    Inst. of Comput. Sci., Tech. Univ. of Denmark, Lyngby, Denmark
  • Volume
    28
  • Issue
    7
  • fYear
    1993
  • fDate
    7/1/1993 12:00:00 AM
  • Firstpage
    840
  • Lastpage
    844
  • Abstract
    A signal flow graph (SFG) structure for simulating passive high-pass ladder filters, called the incremental integration structure, is proposed. The structure requires the use of integrators with nonintegrating inputs, and an implementation based on the MOSFET-C technique is discussed. The incremental integration structure is compared to the leapfrog and direct SFG simulation structures. Leapfrog high-pass filters are relatively simple and show good noise properties, but they are based on differentiators and thus stability problems exist. The direct SFG simulation method is based on integrators and has good stability properties, but it leads to a relatively high circuit complexity and a high noise level. However, the incremental integration structure inherits the low-noise properties of the leapfrog structure and the good stability of the direct SFG simulation method. A sixth-order elliptic high-pass filter chip with a passband frequency of 3.0 kHz has been manufactured, and measurements support the validity of the approach
  • Keywords
    CMOS integrated circuits; active filters; high-pass filters; ladder networks; linear integrated circuits; stability; 3 kHz; C-T high-pass filters; MOSFET-C technique; SFG simulation method; filter chip; incremental integration structure; ladder filters; low-noise properties; passive filter simulation; signal flow graph; sixth-order elliptic filter; stability properties; Circuit noise; Circuit simulation; Circuit stability; Complexity theory; Flow graphs; Frequency; MOSFET circuits; Noise level; Passband; Passive filters;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.222185
  • Filename
    222185