Title :
Observation of noise temperature in the Millikelvin range
Author :
Kamper, R.A. ; Radebaugh, R. ; Zimmerman, J.E.
Abstract :
We report some measurements of noise at very low temperatures, with emphasis on the design and performance of the system used. This system is based on the Josephson effect, and has an observed noise temperature less than 0.005 K.
Keywords :
Circuit noise; Frequency measurement; Josephson junctions; Niobium; Noise measurement; Resistors; Superconducting device noise; Temperature distribution; Thermal resistance; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1971.8426
