DocumentCode :
919355
Title :
Radiation Considerations in the Design of Linear Microwave Transistor Amplifiers for Space Applications
Author :
Gibson, Maurice H. ; Thomson, Ian
Volume :
26
Issue :
10
fYear :
1978
fDate :
10/1/1978 12:00:00 AM
Firstpage :
779
Lastpage :
779
Abstract :
It has been shown recently that a number of different types of microwave transistors used in linear microwave amplifiers designed for space applications are radiation sensitive. Since the transistor hFE is the most radiation sensitive parameter, microwave performance of amplifiers intended for long space missions may degrade prematurely due to changes in transistor bias conditions. A description of the various factors affecting the overall radiation sensitivity of linear microwave amplifiers is given and is followed by experimental results of ground radiation testing on a L-band and a S-band preamplifier. Calculations based on the expected radiation dose levels in space show that neglecting the effects of radiation in amplifier design could lead to mission lives in the order of weeks instead of years. As a result of the experience gained with component and amplifier characterization, an approach to radiation hardening of microwave integrated-circuit transistor amplifiers is presented.
Keywords :
Degradation; Ionizing radiation; Microwave amplifiers; Microwave devices; Microwave integrated circuits; Microwave transistors; Radiation hardening; Satellites; Space charge; Space technology;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1978.1129486
Filename :
1129486
Link To Document :
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