DocumentCode
919355
Title
Radiation Considerations in the Design of Linear Microwave Transistor Amplifiers for Space Applications
Author
Gibson, Maurice H. ; Thomson, Ian
Volume
26
Issue
10
fYear
1978
fDate
10/1/1978 12:00:00 AM
Firstpage
779
Lastpage
779
Abstract
It has been shown recently that a number of different types of microwave transistors used in linear microwave amplifiers designed for space applications are radiation sensitive. Since the transistor hFE is the most radiation sensitive parameter, microwave performance of amplifiers intended for long space missions may degrade prematurely due to changes in transistor bias conditions. A description of the various factors affecting the overall radiation sensitivity of linear microwave amplifiers is given and is followed by experimental results of ground radiation testing on a L-band and a S-band preamplifier. Calculations based on the expected radiation dose levels in space show that neglecting the effects of radiation in amplifier design could lead to mission lives in the order of weeks instead of years. As a result of the experience gained with component and amplifier characterization, an approach to radiation hardening of microwave integrated-circuit transistor amplifiers is presented.
Keywords
Degradation; Ionizing radiation; Microwave amplifiers; Microwave devices; Microwave integrated circuits; Microwave transistors; Radiation hardening; Satellites; Space charge; Space technology;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1978.1129486
Filename
1129486
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