• DocumentCode
    919552
  • Title

    Thin-film processes for microelectronic application

  • Author

    Gregor, Lawrence V.

  • Author_Institution
    IBM Components Division, Hopewell Junction, N. Y.
  • Volume
    59
  • Issue
    10
  • fYear
    1971
  • Firstpage
    1390
  • Lastpage
    1403
  • Abstract
    The rapid development of the microelectronics industry over the last decade has placed exceptional demands on thin-film technology since, to a large extent, it controls the technological pace of that industry. This demand has challenged the thin-film technologist to develop new and improved processes for both thin-film devices as well as for the thin-film conductors and insulation needed by semiconductor devices. The projected demands of the coming decade will require advances in the technology comparable to those of the past decade if the full potential of large scale integration is to be achieved. The variety of materials and processes required to meet adequately the total needs of the industry has necessitated the development of several deposition technologies. Vacuum evaporation, sputtering, chemical vapor deposition, sedimentation, etc., are all in volume manufacturing use and the technologies of each of these techniques has been significantly improved during the past ten years. A similar increase in process capability and control has been necessary in the area of pattern definition in order to allow the development of fine line etching which achieves the required narrow linewidths and separations in today´s microelectronic assemblies. The materials of major interest to the industry as well as the deposition techniques and photoengraving processes used in their processing are highlighted. The discussion includes the status and limitations of the technology as it exists today as well as a consideration of the advantages and disadvantages of the various processes both as of today and for the future.
  • Keywords
    Chemical technology; Conducting materials; Conductive films; Industrial control; Insulation; Microelectronics; Semiconductor devices; Semiconductor thin films; Thin film devices; Transistors;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1971.8445
  • Filename
    1450375