• DocumentCode
    919556
  • Title

    Feedback sensitivity and coherence collapse threshold of semiconductor DFB lasers with complex structures

  • Author

    Grillot, Frédéric ; Thedrez, Bruno ; Duan, Guang-Hua

  • Author_Institution
    OPTO+, Alcatel Res. & Innovation, Marcoussis, France
  • Volume
    40
  • Issue
    3
  • fYear
    2004
  • fDate
    3/1/2004 12:00:00 AM
  • Firstpage
    231
  • Lastpage
    240
  • Abstract
    A general method for evaluating the feedback sensitivity of semiconductor lasers is proposed based on Green´s functions approach. The rate equations derived in this paper generalize works already published to any type of laser cavities such as those with axially varying parameters. The variation of the lasing frequency occurring under external optical feedback is then used to predict the coherence collapse threshold. The approach is validated for conventional DFB lasers by comparing the calculated feedback sensitivity with those obtained from analytical expressions. Both feedback sensitivity and coherence collapse thresholds are then calculated and analyzed for DFB lasers with a chirped grating. A remarkable agreement on the critical feedback level between simulations and measurements is obtained for all the lasers under study.
  • Keywords
    Green´s function methods; chirp modulation; diffraction gratings; distributed feedback lasers; laser cavity resonators; laser feedback; light coherence; optical transfer function; semiconductor lasers; Green function; axially varying parameters; chirped grating; coherence collapse threshold; complex structures; critical feedback level; external optical feedback; feedback sensitivity; laser cavities; lasing frequency; optical feedback; rate equations; semiconductor DFB lasers; transfer function matrix; Chirp; Equations; Fiber lasers; Frequency; Gratings; Laser feedback; Laser noise; Laser theory; Optical feedback; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2003.823031
  • Filename
    1271355