• DocumentCode
    919728
  • Title

    Theoretical investigation of negative differential conductance regime of silicon nanocrystal single-electron devices

  • Author

    Sée, Johann ; Dollfus, Philippe ; Galdin, Sylvie

  • Author_Institution
    Centre Nat. de la Recherche Scientifique-Unite Mixte de Recherche, Univ. Paris, Orsay, France
  • Volume
    53
  • Issue
    5
  • fYear
    2006
  • fDate
    5/1/2006 12:00:00 AM
  • Firstpage
    1268
  • Lastpage
    1273
  • Abstract
    The current-voltage characteristics of metal-insulator-Si quantum dot (QD)-insulator-metal structures are numerically simulated to investigate the design and the possible applications of single-electron devices taking advantage of Coulomb-blockade phenomenon. The simulation technique is based on a physical description of the devices and only requires fundamental quantities of the system but no fitting parameter. One of the originality of this work lies in the accurate calculation of tunneling rates by a perturbation method, which allows us to properly include the effect of a bias voltage on the wave functions in the QD. As a consequence, we show that the bias influence on the wave function may lead to negative-differential-conductance effects depending on the design of the structure.
  • Keywords
    Coulomb blockade; MIS structures; electric admittance; nanostructured materials; semiconductor quantum dots; silicon; single electron devices; Coulomb-blockade phenomenon; Si; metal-insulator-silicon quantum dots; nanocrystal single-electron devices; negative differential conductance; perturbation method; silicon single-electron devices; tunneling rates; wave functions; Current-voltage characteristics; Metal-insulator structures; Nanocrystals; Numerical simulation; Perturbation methods; Quantum dots; Silicon; Single electron devices; Tunneling; Wave functions; Coulomb blockade; single-electron devices; tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.871875
  • Filename
    1624713