• DocumentCode
    91976
  • Title

    IEEE International Integrated Reliability Workshop (IIRW)

  • Volume
    34
  • Issue
    9
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    1204
  • Lastpage
    1204
  • Abstract
    Describes the above-named upcoming conference event. May include topics to be covered or calls for papers.
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2013.2279061
  • Filename
    6584015
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=91976