مرکز منطقه ای اطلاع رساني علوم و فناوري - IEEE International Integrated Reliability Workshop (IIRW)

DocumentCode :

91976

Title :

IEEE International Integrated Reliability Workshop (IIRW)

Volume :

Issue :

fYear :

2013

fDate :

Sept. 2013

Firstpage :

1204

Lastpage :

1204

Abstract :

Describes the above-named upcoming conference event. May include topics to be covered or calls for papers.

fLanguage :

English

Journal_Title :

Electron Device Letters, IEEE

Publisher :

ieee

ISSN :

0741-3106

Type :

jour

DOI :

10.1109/LED.2013.2279061

Filename :

6584015

Link To Document :