DocumentCode :
919797
Title :
On-Chip Supply Noise Regulation Using a Low-Power Digital Switched Decoupling Capacitor Circuit
Author :
Gu, Jie ; Eom, Hanyong ; Kim, Chris H.
Author_Institution :
Texas Instrum. Inc., Dallas, TX
Volume :
44
Issue :
6
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
1765
Lastpage :
1775
Abstract :
On-chip resonant supply noise in the mid-frequency range (i.e., 50-300 MHz) has been identified as the dominant supply noise component in modern microprocessors. To overcome the limited efficiency of conventional decoupling capacitors in reducing the resonant supply noise, this paper proposes a low-power digital switched decoupling capacitor circuit. By adaptively switching the connectivity of decaps according to the measured supply noise, the amount of charge provided by the decaps is dramatically boosted leading to an increased damping of the on-chip supply network. Analysis on the charge transfer during the switching events shows a 6-13X boost of effective decap value. Simulations verify the enhanced noise decoupling performance as well as the effective suppression of the first-droop noise. A 0.13 mum test chip including an on-chip resonance generation circuit and on-chip supply noise sensors was built to demonstrate the proposed switched decap circuit. Measurements confirm an 11X boost in effective decap value and a 9.8 dB suppression in supply noise using the proposed circuit. Compared with previous analog techniques, the proposed digital implementation achieves a 91% reduction in quiescent power consumption with improved tolerance to process-voltage-temperature (PVT) variation and tuning capability for obtaining the optimal switching threshold.
Keywords :
capacitor switching; low-power electronics; charge transfer analysis; low-power digital switched decoupling capacitor circuit; microprocessor; on-chip resonance generation circuit; on-chip supply noise regulation; optimal switching threshold; process-voltage-temperature variation; quiescent power consumption; size 0.13 mum; Circuit noise; Circuit testing; Current measurement; Microprocessors; Noise measurement; Noise reduction; RLC circuits; Resonance; Switched capacitor circuits; Switching circuits; Decoupling capacitor; microprocessor; on-chip regulator; power supply noise; resonance; switched capacitor;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2009.2020454
Filename :
4982870
Link To Document :
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