Title :
New method of resistance measurement
Author_Institution :
Magadh University, University Department of Physics, Bodh Gaya, India
Abstract :
A new method of resistance measurement is reported. A transistor-resistor negative-resistance device has been used for resistance measurements in the range 103¿107 ¿, with an accuracy within ± 1%. The performance of this new method is compared the with conventional 4-point voltmeter-ammeter method.
Keywords :
negative resistance effects; ohmmeters; resistance measurement; 103 to 107 ohms; 4 point voltmeter ammeter method; negative resistance effects; ohmmeters; resistance measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19720400
