Title :
DGS pattern with enhanced effective capacitance
Author :
Wong, C.C. ; Free, C.E.
Author_Institution :
Adv. Technol. Inst., Surrey Univ., Guildford, UK
fDate :
4/13/2006 12:00:00 AM
Abstract :
A new defected ground structure (DGS) pattern with enhanced effective capacitance is presented. The increase in effective capacitance enables the new DGS pattern to achieve a lower resonance than the dumb-bell shaped DGS pattern for the same etched square area dimension. Simulation and experimental results show that a 1.32 GHz lower resonance is achieved with the new DGS pattern, compared to a dumb-bell shaped DGS pattern.
Keywords :
capacitance; etching; microstrip lines; 1.32 GHz; DGS pattern; defected ground structure; effective capacitance;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20060316
