DocumentCode
920217
Title
Testing switching networks for short-circuit faults
Author
Kaposi, J.F. ; Kaposi, A.A.
Author_Institution
Private Address, Worcester Park, UK
Volume
8
Issue
24
fYear
1972
Firstpage
586
Lastpage
587
Abstract
A significant class of faults in switching networks is due to short circuits between signal terminals. A method is proposed which tests networks for such faults, making use of algorithms developed for detecting or diagnosing stuck-at-level faults.
Keywords
fault location; logic circuits; telephone switching equipment; fault location; logic circuit testing; short circuit faults; stuck at level faults; switching network testing; switching networks;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19720425
Filename
4235891
Link To Document