• DocumentCode
    920217
  • Title

    Testing switching networks for short-circuit faults

  • Author

    Kaposi, J.F. ; Kaposi, A.A.

  • Author_Institution
    Private Address, Worcester Park, UK
  • Volume
    8
  • Issue
    24
  • fYear
    1972
  • Firstpage
    586
  • Lastpage
    587
  • Abstract
    A significant class of faults in switching networks is due to short circuits between signal terminals. A method is proposed which tests networks for such faults, making use of algorithms developed for detecting or diagnosing stuck-at-level faults.
  • Keywords
    fault location; logic circuits; telephone switching equipment; fault location; logic circuit testing; short circuit faults; stuck at level faults; switching network testing; switching networks;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19720425
  • Filename
    4235891