Title :
Testing switching networks for short-circuit faults
Author :
Kaposi, J.F. ; Kaposi, A.A.
Author_Institution :
Private Address, Worcester Park, UK
Abstract :
A significant class of faults in switching networks is due to short circuits between signal terminals. A method is proposed which tests networks for such faults, making use of algorithms developed for detecting or diagnosing stuck-at-level faults.
Keywords :
fault location; logic circuits; telephone switching equipment; fault location; logic circuit testing; short circuit faults; stuck at level faults; switching network testing; switching networks;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19720425
