DocumentCode
920597
Title
Surface-resistance measurements of thin conducting films at 10 GHz
Author
Butlin, R.S. ; McPhun, M.K.
Author_Institution
University of Warwick, Department of Engineering, Coventry, UK
Volume
8
Issue
26
fYear
1972
Firstpage
637
Lastpage
639
Abstract
The letter describes a technique for calibration of an H011 cavity for surface-resistance measurements of thin-film and bulk samples at 10 GHz. After calibration and insertion of the sample, it is only necessary to measure the return loss or v.s.w.r. at resonance. The conductivity and surface resistance of the sample may then be read directly from a graph.
Keywords
calibration; cavity resonators; microwave measurement; resistance measurement; thin films; calibration; cavity resonators; conductivity; microwave measurements; resistance measurements; surface phenomena; thin films;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19720461
Filename
4235929
Link To Document