Title :
Statistical approach to the prediction of m.o.s.-device performance
Author :
Hagan, B.J. ; Magowan, J.A.
Author_Institution :
Queen´´s University of Belfast, Department of Electrical & Electronic Engineering, Belfast, UK
Abstract :
A method of statistical analysis is presented for the obtaining of the probability-density function of a performance parameter defined as a function of control parameters with known probability-density functions. Included is an example of the technique applied to the input-voltage/output-voltage relationship of an m.o.s. integrated invertor. The method has the advantage of being significantly faster than a comparable Monte Carlo simulation.
Keywords :
invertors; metal-insulator-semiconductor devices; statistical analysis; IC; MOS; invertors; metal insulator semiconductor devices; performance; statistical analysis;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19730016
