Title :
Noise spectra of a CW silicon TRAPATT oscillator
Abstract :
Noise measurements on a double-sided silicon TRAPATT oscillator have been made and show that the noise is comparable to that of the silicon IMPATT oscillator.
Keywords :
Bandwidth; Current measurement; Diodes; Frequency; Leakage current; Noise measurement; Oscillators; Q measurement; Silicon; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1972.8565
