Title :
Pulsed measuring technique for isothermal transistor characteristics
Author :
Alden, A.W. ; Boothroyd, A.R.
Author_Institution :
Carleton University, Faculty of Engineering, Division of Electronics & Materials Engineering, Ottawa, Canada
Abstract :
A procedure is described which allows the determination of the d.c. and a.c. characteristics of the bipolar transistor under defined isothermal conditions. Representative results are given illustrating the need for such temperature control. Explanations are advanced for the observed temperature dependence of transistor delay time.
Keywords :
bipolar transistors; characteristics measurement; temperature control; bipolar transistors; characteristics measurement; delays; isothermal conditions; pulsed measurement technique; temperature control;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19730061
