• DocumentCode
    921250
  • Title

    Pulsed measuring technique for isothermal transistor characteristics

  • Author

    Alden, A.W. ; Boothroyd, A.R.

  • Author_Institution
    Carleton University, Faculty of Engineering, Division of Electronics & Materials Engineering, Ottawa, Canada
  • Volume
    9
  • Issue
    4
  • fYear
    1973
  • Firstpage
    82
  • Lastpage
    83
  • Abstract
    A procedure is described which allows the determination of the d.c. and a.c. characteristics of the bipolar transistor under defined isothermal conditions. Representative results are given illustrating the need for such temperature control. Explanations are advanced for the observed temperature dependence of transistor delay time.
  • Keywords
    bipolar transistors; characteristics measurement; temperature control; bipolar transistors; characteristics measurement; delays; isothermal conditions; pulsed measurement technique; temperature control;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19730061
  • Filename
    4235998
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=921250