DocumentCode
921386
Title
Voltage drift related to low-frequency noise in reference diodes
Author
Lauritzen, P.O.
Volume
60
Issue
2
fYear
1972
Firstpage
236
Lastpage
237
Abstract
The theoretical relationship between low-frequency noise and long-term voltage drift is developed for use as a convenient method of predicting voltage drift from low-frequency noise measurements. Experimental correlation is obtained only for certain types of diodes.
Keywords
Diodes; Equations; Low-frequency noise; Magnetic heads; Magnetic properties; Noise measurement; Region 1; Region 2; Skin; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1972.8606
Filename
1450536
Link To Document