Title :
An Improved Computational Method for Noise Parameter Measurement
Author :
Mitama, Masataka ; Katoh, Hidehiko
fDate :
6/1/1979 12:00:00 AM
Abstract :
Conventional methods for noise parameter measurement for linear noisy two-ports have been improved by introducing a computational method for evaluating measured admittance errors. Derivation and comparison with a conventional method are given. Noise parameters of a packaged 0.5-mu m gate-length GaAs MESFET (NE38806) were successfully measured using the proposed technique.
Keywords :
Admittance measurement; Data processing; Electrical resistance measurement; Gallium arsenide; Least squares methods; MESFETs; Noise figure; Noise measurement; Packaging; Performance evaluation;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1979.1129680
