• DocumentCode
    921402
  • Title

    An Improved Computational Method for Noise Parameter Measurement

  • Author

    Mitama, Masataka ; Katoh, Hidehiko

  • Volume
    27
  • Issue
    6
  • fYear
    1979
  • fDate
    6/1/1979 12:00:00 AM
  • Firstpage
    612
  • Lastpage
    615
  • Abstract
    Conventional methods for noise parameter measurement for linear noisy two-ports have been improved by introducing a computational method for evaluating measured admittance errors. Derivation and comparison with a conventional method are given. Noise parameters of a packaged 0.5-mu m gate-length GaAs MESFET (NE38806) were successfully measured using the proposed technique.
  • Keywords
    Admittance measurement; Data processing; Electrical resistance measurement; Gallium arsenide; Least squares methods; MESFETs; Noise figure; Noise measurement; Packaging; Performance evaluation;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1979.1129680
  • Filename
    1129680
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=921402