DocumentCode :
9216
Title :
A Vernier Time-to-Digital Converter With Delay Latch Chain Architecture
Author :
Andersson, Niklas U. ; Vesterbacka, Mark
Author_Institution :
Dept. of Electr. Eng., Linkoping Univ., Linkoping, Sweden
Volume :
61
Issue :
10
fYear :
2014
fDate :
Oct. 2014
Firstpage :
773
Lastpage :
777
Abstract :
A new Vernier time-to-digital converter (TDC) architecture using a delay line and a chain of delay latches is proposed. The delay latches replace the functionality of one delay chain and the sample register commonly found in Vernier converters, hereby enabling power and hardware efficiency improvements. The delay latches can be implemented using either standard or full custom cells, allowing the architecture to be implemented in field-programmable gate arrays, digital synthesized application specific integrated circuits, or in full custom design flows. To demonstrate the proposed concept, a 7-bit Vernier TDC has been implemented in a standard 65-nm CMOS process with an active core size of 33 μm × 120 μm. The time resolution is 5.7 ps with a power consumption of 1.75 mW measured at a conversion rate of 100 MS/s.
Keywords :
CMOS logic circuits; application specific integrated circuits; delay lines; field programmable gate arrays; flip-flops; time-digital conversion; Vernier time-to-digital converter; delay latch chain architecture; delay lines; digital synthesized application specific integrated circuits; field programmable gate arrays; power 1.75 mW; size 120 mum; size 33 mum; size 65 nm; word length 7 bit; CMOS integrated circuits; Delay lines; Delays; Latches; Power demand; Standards; Transistors; CMOS; Vernier; delay latch; time-to-digital converter (TDC);
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2014.2345289
Filename :
6870460
Link To Document :
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