• DocumentCode
    921648
  • Title

    Method for measuring diode junction parameters as a function of current density and temperature

  • Author

    Howes, M.J.

  • Volume
    60
  • Issue
    3
  • fYear
    1972
  • fDate
    3/1/1972 12:00:00 AM
  • Firstpage
    329
  • Lastpage
    331
  • Abstract
    A simple rapid and accurate method of determining the junction parameters m and Isin the I-V relationship I = Is[exp (eV/mkT) - 1] is described, which enables their dependence on current density and temperature to be examined.
  • Keywords
    Circuits; Current density; Current measurement; Density measurement; Diodes; Ferrites; Frequency; RF signals; Temperature measurement; Varactors;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1972.8628
  • Filename
    1450558
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=921648