Title :
On the Use of a Microstrip Three-Line System as a Six-Port Reflectometer
Author :
Collier, Richard J. ; El-Deeb, Nabil A.
fDate :
10/1/1979 12:00:00 AM
Abstract :
The scattering parameters for a coupled symmetrical three-Iine system in an inhomogeneous dielectric medium (e.g., microstrip) are derived directly in terms of a set of three orthogonal modes. The obtained results show that the condition for isolation of nonadjacent ports (e.g., ports 1 and 3 in Fig. 1) does not result from putting the corresponding per unit length immittance parameters equal to zero (i.e., z13 =y13 = 0). The use of such a three-line system as a six-port reflectometer is analyzed in terms of the derived scattering parameters. The reflectometer discussed in this paper allows an unknown impedance to be measured using a standard impedance.
Keywords :
Couplers; Electrons; Fabrication; Laboratories; Microstrip; Physics; Scattering parameters; Solid state circuits; Transmission line matrix methods; Voltage;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1979.1129747