DocumentCode :
922114
Title :
Multivalued SRAM cell using resonant tunneling diodes
Author :
Wei, Sen-Jung ; Lin, Hung Chang
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
Volume :
27
Issue :
2
fYear :
1992
fDate :
2/1/1992 12:00:00 AM
Firstpage :
212
Lastpage :
216
Abstract :
A multivalued SRAM cell using a vertically integrated multipeak resonant tunneling diode (RTD) pair is described. Two RTDs in series can have 2N+1 stable states. With this concept, a five-stable-state memory cell has been implemented with two 2-peak RTDs. Several designs are presented for a high-speed static random access multivalued memory using the folding characteristics of RTDs. The different designs are described and studied by comparing their power consumption under different conditions of device parameters and switching speed. The authors show that the proposed memory cell using a pair of multipeak RTDs yields the best result from the standpoint of size, power dissipation, and speed among the RTD memory cells discussed
Keywords :
SRAM chips; resonant tunnelling devices; device parameters; five-stable-state memory cell; folding characteristics; multipeak RTD pair; multivalued SRAM cell; power consumption; resonant tunneling diodes; static random access; switching speed; vertically integrated diodes; Diodes; Energy consumption; Integrated circuit interconnections; Multivalued logic; Power dissipation; Power system interconnection; Random access memory; Resistors; Resonant tunneling devices; Stacking;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.127345
Filename :
127345
Link To Document :
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