• DocumentCode
    922114
  • Title

    Multivalued SRAM cell using resonant tunneling diodes

  • Author

    Wei, Sen-Jung ; Lin, Hung Chang

  • Author_Institution
    Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
  • Volume
    27
  • Issue
    2
  • fYear
    1992
  • fDate
    2/1/1992 12:00:00 AM
  • Firstpage
    212
  • Lastpage
    216
  • Abstract
    A multivalued SRAM cell using a vertically integrated multipeak resonant tunneling diode (RTD) pair is described. Two RTDs in series can have 2N+1 stable states. With this concept, a five-stable-state memory cell has been implemented with two 2-peak RTDs. Several designs are presented for a high-speed static random access multivalued memory using the folding characteristics of RTDs. The different designs are described and studied by comparing their power consumption under different conditions of device parameters and switching speed. The authors show that the proposed memory cell using a pair of multipeak RTDs yields the best result from the standpoint of size, power dissipation, and speed among the RTD memory cells discussed
  • Keywords
    SRAM chips; resonant tunnelling devices; device parameters; five-stable-state memory cell; folding characteristics; multipeak RTD pair; multivalued SRAM cell; power consumption; resonant tunneling diodes; static random access; switching speed; vertically integrated diodes; Diodes; Energy consumption; Integrated circuit interconnections; Multivalued logic; Power dissipation; Power system interconnection; Random access memory; Resistors; Resonant tunneling devices; Stacking;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.127345
  • Filename
    127345