Title :
Si and GaAs 0.5 μm-gate Schottky-barrier field-effect transistors
Author :
Baechtold, W. ; Daetwyler, K. ; Forster, T. ; Mohr, T.O. ; Walter, W. ; Wolf, Philip
Author_Institution :
IBM Zurich Research Laboratory, Rÿschlikon, Switzerland
Abstract :
Si and GaAs Schottky-barrier field-effect transistors with gate lengths of 0.5 μm have been experimentally realised. Noise and gain properties were measured in the microwave range up to 20 GHz. When compared with 1 μm-gate f.e.t.s, the devices show considerable improvements in gain and in noise figure. At 10 GHz, the following values were measured: Si m.e.s.f.e.t.: maximum available gain = 5.9 dB, noise figure = 5.8 dB; GaAs m.e.s.f.e.t.: maximum available gain = 12.8 dB, noise figure = 3.7 dB.
Keywords :
Schottky-barrier diodes; field effect transistors; gain measurement; noise measurement; solid-state microwave devices; 20 GHZ; GaAs; Schottky effect; Si; field effect transistors; gain; noise figure; solid state microwave devices;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19730168