• DocumentCode
    922349
  • Title

    Si and GaAs 0.5 μm-gate Schottky-barrier field-effect transistors

  • Author

    Baechtold, W. ; Daetwyler, K. ; Forster, T. ; Mohr, T.O. ; Walter, W. ; Wolf, Philip

  • Author_Institution
    IBM Zurich Research Laboratory, Rÿschlikon, Switzerland
  • Volume
    9
  • Issue
    10
  • fYear
    1973
  • Firstpage
    232
  • Lastpage
    234
  • Abstract
    Si and GaAs Schottky-barrier field-effect transistors with gate lengths of 0.5 μm have been experimentally realised. Noise and gain properties were measured in the microwave range up to 20 GHz. When compared with 1 μm-gate f.e.t.s, the devices show considerable improvements in gain and in noise figure. At 10 GHz, the following values were measured: Si m.e.s.f.e.t.: maximum available gain = 5.9 dB, noise figure = 5.8 dB; GaAs m.e.s.f.e.t.: maximum available gain = 12.8 dB, noise figure = 3.7 dB.
  • Keywords
    Schottky-barrier diodes; field effect transistors; gain measurement; noise measurement; solid-state microwave devices; 20 GHZ; GaAs; Schottky effect; Si; field effect transistors; gain; noise figure; solid state microwave devices;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19730168
  • Filename
    4236110