DocumentCode
922401
Title
Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer
Author
Engen, Glenn F. ; Hoer, Cletus A.
Volume
27
Issue
12
fYear
1979
fDate
12/1/1979 12:00:00 AM
Firstpage
987
Lastpage
993
Abstract
In an earlier paper, the use of a "thru-short-delay" (TSD) technique for calibrating the dual six-port automatic network analyzer was described. Another scheme required only a length of precision transmission line and a "calibration circuit." The better features of these two somewhat different approaches have now been combined and the requirement for either a known short, or a "calibration circuit" eliminated. This paper will develop the theory for this new procedure.
Keywords
Calibration; Circuits; Detectors; Helium; Microwave devices; Microwave measurements; Particle measurements; Scattering parameters; Senior members; Test equipment;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1979.1129778
Filename
1129778
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