Title :
Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer
Author :
Engen, Glenn F. ; Hoer, Cletus A.
fDate :
12/1/1979 12:00:00 AM
Abstract :
In an earlier paper, the use of a "thru-short-delay" (TSD) technique for calibrating the dual six-port automatic network analyzer was described. Another scheme required only a length of precision transmission line and a "calibration circuit." The better features of these two somewhat different approaches have now been combined and the requirement for either a known short, or a "calibration circuit" eliminated. This paper will develop the theory for this new procedure.
Keywords :
Calibration; Circuits; Detectors; Helium; Microwave devices; Microwave measurements; Particle measurements; Scattering parameters; Senior members; Test equipment;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1979.1129778