DocumentCode :
922401
Title :
Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer
Author :
Engen, Glenn F. ; Hoer, Cletus A.
Volume :
27
Issue :
12
fYear :
1979
fDate :
12/1/1979 12:00:00 AM
Firstpage :
987
Lastpage :
993
Abstract :
In an earlier paper, the use of a "thru-short-delay" (TSD) technique for calibrating the dual six-port automatic network analyzer was described. Another scheme required only a length of precision transmission line and a "calibration circuit." The better features of these two somewhat different approaches have now been combined and the requirement for either a known short, or a "calibration circuit" eliminated. This paper will develop the theory for this new procedure.
Keywords :
Calibration; Circuits; Detectors; Helium; Microwave devices; Microwave measurements; Particle measurements; Scattering parameters; Senior members; Test equipment;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1979.1129778
Filename :
1129778
Link To Document :
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