• DocumentCode
    922401
  • Title

    Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer

  • Author

    Engen, Glenn F. ; Hoer, Cletus A.

  • Volume
    27
  • Issue
    12
  • fYear
    1979
  • fDate
    12/1/1979 12:00:00 AM
  • Firstpage
    987
  • Lastpage
    993
  • Abstract
    In an earlier paper, the use of a "thru-short-delay" (TSD) technique for calibrating the dual six-port automatic network analyzer was described. Another scheme required only a length of precision transmission line and a "calibration circuit." The better features of these two somewhat different approaches have now been combined and the requirement for either a known short, or a "calibration circuit" eliminated. This paper will develop the theory for this new procedure.
  • Keywords
    Calibration; Circuits; Detectors; Helium; Microwave devices; Microwave measurements; Particle measurements; Scattering parameters; Senior members; Test equipment;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1979.1129778
  • Filename
    1129778