DocumentCode :
922634
Title :
Deep Sub-micron Design
Author :
Ganguly, Shaumik ; Mak, T.M. ; Scheffer, Lou ; Wolf, Werner ; Yeager, K.
Volume :
13
Issue :
2
fYear :
1996
Firstpage :
83
Keywords :
Debugging; Formal verification; Hardware; Manufacturing; Microprocessors; Process design; Roads; Silicon; Stress; Testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1996.500203
Filename :
500203
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=922634
