DocumentCode

922634

Title

Deep Sub-micron Design

Author

Ganguly, Shaumik ; Mak, T.M. ; Scheffer, Lou ; Wolf, Werner ; Yeager, K.

Volume

13

Issue

2

fYear

1996

Firstpage

83

Keywords

Debugging; Formal verification; Hardware; Manufacturing; Microprocessors; Process design; Roads; Silicon; Stress; Testing;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.1996.500203

Filename

500203