• DocumentCode
    922655
  • Title

    Galileo probe Li-SO2 battery cell life testing

  • Author

    Hofland, L.M. ; Stofel, E.J. ; Taenaka, R.K.

  • Author_Institution
    Sverdrup Technol. Inc., USA
  • Volume
    11
  • Issue
    6
  • fYear
    1996
  • fDate
    6/1/1996 12:00:00 AM
  • Firstpage
    14
  • Lastpage
    18
  • Abstract
    Several hundred D-sized, Li-SO2 battery cells have been in a carefully controlled quiescent storage test for up to 14 years, starting at Honeywell but completing at the NASA Ames Research Center, in support of the Atmospheric Probe portion of the Galileo Mission to the planet Jupiter. This population of cells includes similar samples from 8 different manufacturing lots; the earliest from October 1981, the latest from October 1988. The baseline samples have been divided among several storage chambers, each having its own constant temperature, respectively, set between 0°C to 40°C. Non-invasive measurements have been made repeatedly of open circuit voltage and internal resistance (at 1000 Hz). At intervals, a small portion of the cells has been removed from storage and fully discharged under repetitive conditions, thus assessing any storage related loss of discharge capacity. The results show that for storage up to 20°C the cells have excellent stability. Above 20°C noticeable degradation occurs
  • Keywords
    electric resistance measurement; life testing; lithium; primary cells; space vehicle power plants; sulphur compounds; voltage measurement; 0 to 40 C; 1000 Hz; 14 y; 20 C; D-size; Galileo Mission; Galileo probe; Honeywell; Jupiter; Li-SO2; Li-SO2 battery cell; NASA Ames Research Center; atmospheric probe; baseline samples; degradation; discharge capacity; internal resistance; life testing; noninvasive measurement; open circuit voltage; quiescent storage test; stability; storage chambers; storage related loss; Batteries; Electrical resistance measurement; Extraterrestrial measurements; Jupiter; Manufacturing; NASA; Planets; Probes; Temperature; Testing;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/62.500205
  • Filename
    500205