DocumentCode
922669
Title
Collector design tradeoffs for low voltage applications of advanced bipolar transistors
Author
Kumar, Jagadesh M. ; Sadovnikov, Alexei D. ; Roulston, David J.
Author_Institution
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Volume
40
Issue
8
fYear
1993
fDate
8/1/1993 12:00:00 AM
Firstpage
1478
Lastpage
1483
Abstract
The values of BV ceo are computed for transistors with highly doped collectors and with thin reach-through collectors, using various sets of ionization coefficients including new data. Computed values of BV ceo are compared with experimental results. It is shown that transistors with thin reach-through collectors have higher current capability for any given BV ceo compared to those with highly doped collectors. Tradeoffs in terms of BV ceo, maximum collector current and the maximum frequency of operation are studied for transistors with highly doped and thin reach-through collectors
Keywords
bipolar transistors; doping profiles; advanced bipolar transistors; current capability; highly doped collectors; ionization coefficients; low voltage applications; maximum collector current; reach-through; Bipolar transistors; Breakdown voltage; Circuits; Doping; Electrons; Frequency; Impact ionization; Kirk field collapse effect; Low voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.223708
Filename
223708
Link To Document