• DocumentCode
    922669
  • Title

    Collector design tradeoffs for low voltage applications of advanced bipolar transistors

  • Author

    Kumar, Jagadesh M. ; Sadovnikov, Alexei D. ; Roulston, David J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
  • Volume
    40
  • Issue
    8
  • fYear
    1993
  • fDate
    8/1/1993 12:00:00 AM
  • Firstpage
    1478
  • Lastpage
    1483
  • Abstract
    The values of BVceo are computed for transistors with highly doped collectors and with thin reach-through collectors, using various sets of ionization coefficients including new data. Computed values of BVceo are compared with experimental results. It is shown that transistors with thin reach-through collectors have higher current capability for any given BVceo compared to those with highly doped collectors. Tradeoffs in terms of BVceo, maximum collector current and the maximum frequency of operation are studied for transistors with highly doped and thin reach-through collectors
  • Keywords
    bipolar transistors; doping profiles; advanced bipolar transistors; current capability; highly doped collectors; ionization coefficients; low voltage applications; maximum collector current; reach-through; Bipolar transistors; Breakdown voltage; Circuits; Doping; Electrons; Frequency; Impact ionization; Kirk field collapse effect; Low voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.223708
  • Filename
    223708