• DocumentCode
    922937
  • Title

    Accurate conductor Q-factor of dielectric resonator placed in an MIC environment

  • Author

    Mongia, R.K. ; Bhartia, P.

  • Author_Institution
    Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
  • Volume
    41
  • Issue
    3
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    445
  • Lastpage
    449
  • Abstract
    The unloaded Q-factor of a dielectric resonator is degraded due to conductor loss when it is placed in an MIC environment. The authors report approximate but quite accurate closed form expressions for the Q-factor due to conductor loss. The results obtained are in good agreement with those of rigorous numerical methods. The effect of geometrical parameters on the useful tuning range of the structure is studied. Finally, an explicit relationship between the resonant frequency sensitivity factors and the conductor Q-factor is derived
  • Keywords
    Q-factor; dielectric resonators; losses; microwave integrated circuits; tuning; MIC environment; conductor Q-factor; conductor loss; dielectric resonator; resonant frequency sensitivity factors; tuning range; Conducting materials; Conductors; Degradation; Dielectric losses; Dielectric materials; Helium; Microwave integrated circuits; Q factor; Resonant frequency; Tuning;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.223743
  • Filename
    223743