DocumentCode :
922937
Title :
Accurate conductor Q-factor of dielectric resonator placed in an MIC environment
Author :
Mongia, R.K. ; Bhartia, P.
Author_Institution :
Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
Volume :
41
Issue :
3
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
445
Lastpage :
449
Abstract :
The unloaded Q-factor of a dielectric resonator is degraded due to conductor loss when it is placed in an MIC environment. The authors report approximate but quite accurate closed form expressions for the Q-factor due to conductor loss. The results obtained are in good agreement with those of rigorous numerical methods. The effect of geometrical parameters on the useful tuning range of the structure is studied. Finally, an explicit relationship between the resonant frequency sensitivity factors and the conductor Q-factor is derived
Keywords :
Q-factor; dielectric resonators; losses; microwave integrated circuits; tuning; MIC environment; conductor Q-factor; conductor loss; dielectric resonator; resonant frequency sensitivity factors; tuning range; Conducting materials; Conductors; Degradation; Dielectric losses; Dielectric materials; Helium; Microwave integrated circuits; Q factor; Resonant frequency; Tuning;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.223743
Filename :
223743
Link To Document :
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