DocumentCode
923006
Title
Measurement of 2-port devices by a reflectometer system
Author
Cullen, A.L.
Author_Institution
University College London, Department of Electronic & Electrical Engineering, London, UK
Volume
129
Issue
6
fYear
1982
fDate
12/1/1982 12:00:00 AM
Firstpage
333
Lastpage
337
Abstract
An alternative to the dual 6-port technique for the measurement of 2-port devices is described. A single reflectometer only is used, together with a directional coupler. A method for calibrating the complete system is described.
Keywords
microwave reflectometry; 2-port devices; basis functions; calibration; directional coupler; dual 6-port technique; range switching; reflectometer system; scattering matrix;
fLanguage
English
Journal_Title
Microwaves, Optics and Antennas, IEE Proceedings H
Publisher
iet
ISSN
0143-7097
Type
jour
DOI
10.1049/ip-h-1:19820067
Filename
4645505
Link To Document