Title :
Measurement of 2-port devices by a reflectometer system
Author_Institution :
University College London, Department of Electronic & Electrical Engineering, London, UK
fDate :
12/1/1982 12:00:00 AM
Abstract :
An alternative to the dual 6-port technique for the measurement of 2-port devices is described. A single reflectometer only is used, together with a directional coupler. A method for calibrating the complete system is described.
Keywords :
microwave reflectometry; 2-port devices; basis functions; calibration; directional coupler; dual 6-port technique; range switching; reflectometer system; scattering matrix;
Journal_Title :
Microwaves, Optics and Antennas, IEE Proceedings H
DOI :
10.1049/ip-h-1:19820067
