DocumentCode :
923062
Title :
A new approach to bipolar device modeling for CAD
Author :
Fossum, Jerry G.
Volume :
60
Issue :
6
fYear :
1972
fDate :
6/1/1972 12:00:00 AM
Firstpage :
756
Lastpage :
757
Abstract :
A new approach to modeling which yields accurate large-signal models for bipolar devices, including all important fundamental effects and their interactions, is introduced. The resulting models lend themselves to efficient analysis by SCEPTRE while demonstrating substantial exactness. Steady-state transistor-model characteristics depicting general capabilities of the modeling technique are presented.
Keywords :
Capacitance; Computational modeling; Dielectric loss measurement; Dielectric materials; Loss measurement; Optical fiber communication; Optical fiber losses; Optical fibers; Steady-state; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1972.8765
Filename :
1450695
Link To Document :
بازگشت