DocumentCode :
923459
Title :
Patents
Volume :
1
Issue :
11
fYear :
1986
Firstpage :
33
Lastpage :
36
Abstract :
These Patent Abstracts of recently issued patents are intended to provide the minimum information necessary for readers to determine if they are interested in examining the patent in more detail. Complete copies of patents are available for a small fee by writing: US Patent and Trademark Office, Washington, DC, USA.
Keywords :
Electric variables measurement; FETs; Frequency measurement; Impedance measurement; Patents; Phase measurement; Power measurement; Signal processing; Storage automation; Voltage;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
Publisher :
ieee
ISSN :
0885-8985
Type :
jour
DOI :
10.1109/MAES.1986.5005000
Filename :
5005000
Link To Document :
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