DocumentCode :
923489
Title :
Low-frequency measurement of small delay times with application to microwave transistor measurement
Author :
Zakarevicius, R.A.
Volume :
60
Issue :
7
fYear :
1972
fDate :
7/1/1972 12:00:00 AM
Firstpage :
910
Lastpage :
911
Abstract :
A simple low-frequency technique for the measurement of small delay times using an operational amplifier as an integrator is described. It is shown that the frequency capability of the operational amplifier is relatively unimportant and that it should be possible to use this technique for the measurement of the transit times of transistors well into the microwave range.
Keywords :
Circuits; Delay effects; Differential amplifiers; Electrons; Measurement techniques; Microwave measurements; Microwave transistors; Operational amplifiers; Transfer functions; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1972.8802
Filename :
1450732
Link To Document :
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