DocumentCode :
923506
Title :
A Numerical Simulation Code for Electronic and Ionic Transients From a Time-Resolved Pulsed Townsend Experiment
Author :
de Urquijo, J. ; Juarez, A.M. ; Rodríguez-Luna, J.C. ; Ramos-Salas, J.S.
Author_Institution :
Univ. Nacional Autonoma de Mexico, Morelos
Volume :
35
Issue :
5
fYear :
2007
Firstpage :
1204
Lastpage :
1209
Abstract :
A numerical code which calculating the spatio-temporal development of the discharge current in the Townsend regime has been developed. This code was written in Fortran 77. The individual contribution of electrons, positive, and negative ions to the total measurable current in the pulsed discharge is calculated by solving the corresponding set of coupled continuity equations for each species, for which boundary and initial conditions are set adequately. This simulation code is also capable of considering a more realistic scheme of photoelectron emission, such as that produced using a pulsed ultraviolet laser. In addition, the processes of ion and electron drift and longitudinal diffusion, electron detachment, negative-ion stabilization, and ion conversion have been calculated successfully. Some of these effects are extremely difficult to model analytically, and the simultaneous inclusion of two or more of them proves practically impossible. The power of this method in simulating complex discharge situations is discussed in this paper by means of examples considering the processes of electron and ion drift, diffusion, electron impact ionization and attachment, electron detachment, and negative-ion stabilization.
Keywords :
Townsend discharge; electron attachment; electron detachment; electron impact ionisation; plasma collision processes; plasma simulation; plasma transport processes; spatiotemporal phenomena; Fortran 77; continuity equations; discharge current; electron attachment; electron detachment; electron drift; electron impact ionization; electronic transients; ion conversion; ion drift; ionic transients; longitudinal diffusion; negative ions; negative-ion stabilization; numerical simulation code; photoelectron emission; positive ions; pulsed discharge; pulsed ultraviolet laser; spatiotemporal development; time-resolved pulsed Townsend experiment; Current measurement; Electrons; Ionization; Numerical simulation; Optical pulses; Plasma applications; Plasma properties; Plasma simulation; Plasma temperature; Pollution measurement; Attachment; continuity equations; diffusion; drift velocity and diffusion; electron and ion swarms; electron detachment; finite difference methods; ionization; ionization and attachment; low temperature plasmas; negative ions; numerical simulation codes; pulsed Townsend experiment;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2007.905111
Filename :
4343200
Link To Document :
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