• DocumentCode
    923506
  • Title

    A Numerical Simulation Code for Electronic and Ionic Transients From a Time-Resolved Pulsed Townsend Experiment

  • Author

    de Urquijo, J. ; Juarez, A.M. ; Rodríguez-Luna, J.C. ; Ramos-Salas, J.S.

  • Author_Institution
    Univ. Nacional Autonoma de Mexico, Morelos
  • Volume
    35
  • Issue
    5
  • fYear
    2007
  • Firstpage
    1204
  • Lastpage
    1209
  • Abstract
    A numerical code which calculating the spatio-temporal development of the discharge current in the Townsend regime has been developed. This code was written in Fortran 77. The individual contribution of electrons, positive, and negative ions to the total measurable current in the pulsed discharge is calculated by solving the corresponding set of coupled continuity equations for each species, for which boundary and initial conditions are set adequately. This simulation code is also capable of considering a more realistic scheme of photoelectron emission, such as that produced using a pulsed ultraviolet laser. In addition, the processes of ion and electron drift and longitudinal diffusion, electron detachment, negative-ion stabilization, and ion conversion have been calculated successfully. Some of these effects are extremely difficult to model analytically, and the simultaneous inclusion of two or more of them proves practically impossible. The power of this method in simulating complex discharge situations is discussed in this paper by means of examples considering the processes of electron and ion drift, diffusion, electron impact ionization and attachment, electron detachment, and negative-ion stabilization.
  • Keywords
    Townsend discharge; electron attachment; electron detachment; electron impact ionisation; plasma collision processes; plasma simulation; plasma transport processes; spatiotemporal phenomena; Fortran 77; continuity equations; discharge current; electron attachment; electron detachment; electron drift; electron impact ionization; electronic transients; ion conversion; ion drift; ionic transients; longitudinal diffusion; negative ions; negative-ion stabilization; numerical simulation code; photoelectron emission; positive ions; pulsed discharge; pulsed ultraviolet laser; spatiotemporal development; time-resolved pulsed Townsend experiment; Current measurement; Electrons; Ionization; Numerical simulation; Optical pulses; Plasma applications; Plasma properties; Plasma simulation; Plasma temperature; Pollution measurement; Attachment; continuity equations; diffusion; drift velocity and diffusion; electron and ion swarms; electron detachment; finite difference methods; ionization; ionization and attachment; low temperature plasmas; negative ions; numerical simulation codes; pulsed Townsend experiment;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2007.905111
  • Filename
    4343200