• DocumentCode
    923847
  • Title

    Artificial Dielectrics for Microwaves

  • Author

    Sharpless, W.M.

  • Author_Institution
    Bell Telephone Laboratories, Inc., Holmdel, N.J.
  • Volume
    39
  • Issue
    11
  • fYear
    1951
  • Firstpage
    1389
  • Lastpage
    1393
  • Abstract
    This paper presents a procedure for measuring the dielectric properties of metal-loaded artificial dielectrics in the microwave region by the use of the short-circuited line method. Formulas, based on transmission-line theory, are included and serve as guides in predicting the approximate dielectric properties of certain loading configurations.
  • Keywords
    Delay; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Frequency measurement; Lenses; Microwave measurements; Microwave theory and techniques; Transmission lines; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1951.273600
  • Filename
    4050558