Title :
Artificial Dielectrics for Microwaves
Author_Institution :
Bell Telephone Laboratories, Inc., Holmdel, N.J.
Abstract :
This paper presents a procedure for measuring the dielectric properties of metal-loaded artificial dielectrics in the microwave region by the use of the short-circuited line method. Formulas, based on transmission-line theory, are included and serve as guides in predicting the approximate dielectric properties of certain loading configurations.
Keywords :
Delay; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Frequency measurement; Lenses; Microwave measurements; Microwave theory and techniques; Transmission lines; Wavelength measurement;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1951.273600
