DocumentCode :
924063
Title :
Physical problems of small structures in electronics
Author :
Keyes, Robert W.
Author_Institution :
IBM T. J. Watson Research Center, Yorktown Heights, N. Y.
Volume :
60
Issue :
9
fYear :
1972
Firstpage :
1055
Lastpage :
1062
Abstract :
A steady improvement in electronic computers through nearly two decades has been made possible by continued progress in miniaturization. An obvious question is, What will eventually limit the reduction in size of electronic components? An attempt is made to formulate a quantitative view of some of the phenomena that may limit the extension of present technologies to ever smaller dimensions. Specifically treated are the problems of removing heat from small structures, of the effect of the high resistance of small conductors, and of electromigration. It is concluded that of these the resistive and electromigration effects represent the most significant limits on size, and that they will prevent the dimensions of conductors from being reduced below a few hundred angstrom units.
Keywords :
Atomic measurements; Costs; Data processing; Electrons; Fabrication; History; Integrated circuit technology; Lithography; Manufacturing; Physics computing;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1972.8853
Filename :
1450783
Link To Document :
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