Title :
Gate flicker noise in MOSFET´s
Author :
Haslett, J.W. ; Kendall, E.J.M.
Abstract :
A simple technique for measuring the gate flicker noise component in MOS field-effect transistors (MOSFET´s) is presented. The method gives an estimate of the ratio of gate to drain flicker noise currents as compared to the ratio for thermal noise. In addition, the degree of correlation between the gate and drain flicker noise components can be obtained.
Keywords :
1f noise; Copper; Electrodes; Fabry-Perot; Frequency; Low-frequency noise; Semiconductor diodes; Soldering; Steel; Wire;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1972.8869
