Title :
Temperature-dependent electroluminescence of AlGaN-based UV LEDs
Author :
Cao, X.A. ; LeBoeuf, S.F. ; Stecher, T.E.
Author_Institution :
GE Global Res. Center, Niskayuna, NY, USA
fDate :
5/1/2006 12:00:00 AM
Abstract :
The electrical and optical characteristics of AlGaN-based ultraviolet (UV) light-emitting diodes (LEDs) (265-365 nm) at elevated temperatures (25°C-175°C) were investigated, and compared to those of InGaN-based visible LEDs (400-465 nm). Strong carrier localization and localized-state emission were retained in the InGaN LEDs up to 175°C, leading to temperature-independent emission intensity at low-energy tails. The deep-UV LEDs, however, showed dominant band-edge emission, much smaller alloy broadening, and weaker localization effects. The optical power of the UV LEDs decreased much more rapidly with increasing temperature. The characteristic temperature was in the range of 31-73 K, and decreased with increasing Al content in the active region. These findings implicate the lack of localization effects in AlGaN alloys as one of the causal factors in the poor thermal performance of the UV LEDs and suggest that increasing carrier-confining potentials will provide a critical means to improve their radiative efficiencies.
Keywords :
III-V semiconductors; aluminium compounds; electroluminescence; gallium compounds; light emitting diodes; localised states; wide band gap semiconductors; 25 to 175 C; 265 to 365 nm; 31 to 73 K; 400 to 465 nm; AlGaN; InGaN; carrier confinement; carrier localization; characteristic temperature; deep-UV LED; dominant band-edge emission; electrical characteristic; localization effects; localized-state emission; optical characteristics; optical power; radiative efficiency; temperature-dependent electroluminescence; thermal performance; ultraviolet light-emitting diodes; Aluminum gallium nitride; Biomedical optical imaging; Electroluminescence; Electronic packaging thermal management; Light emitting diodes; Optical saturation; Optical sensors; Resistance heating; Stimulated emission; Temperature distribution; Carrier confinement; electroluminescence (EL); light-emitting diode (LED); localization effects;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2006.873763