DocumentCode :
924574
Title :
Ultrahigh-performance 8-GHz SiGe power HBT
Author :
Guogong Wang ; Hao-Chih Yuan ; Zhenqiang Ma
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin, Madison, WI, USA
Volume :
27
Issue :
5
fYear :
2006
fDate :
5/1/2006 12:00:00 AM
Firstpage :
371
Lastpage :
373
Abstract :
This letter has demonstrated the state-of-the-art SiGe power heterojunction bipolar transistors (HBTs) operating at 8 GHz. In a common-base configuration, a continuous wave output power of 27.72 dBm with a concurrent power gain of 12.19 dB was measured at a peak power-added efficiency of 60.6% from a single SiGe HBT with a 3-μm emitter finger stripe width and a 1340 μm2 total emitter area. The highest power-performance figure of merit (FOM) of 3.8×105 mW/spl middot/GHz2 achieved from the device was resulted from using an optimized SiGe heterostructure and a compact device layout, which is made possible with a heavily doped base region.
Keywords :
heterojunction bipolar transistors; microwave bipolar transistors; power bipolar transistors; semiconductor doping; 12.19 dB; 3 micron; 8 GHz; SiGe; heterojunction bipolar transistors; power HBT; semiconductor doping; Doping profiles; Gain; Germanium silicon alloys; Heterojunction bipolar transistors; Niobium; Power generation; Proximity effect; Radio frequency; Silicon germanium; Thermal degradation; Common–base (CB); SiGe; heterojunction bipolar transistors (HBTs);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2006.873766
Filename :
1626460
Link To Document :
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