• DocumentCode
    924808
  • Title

    Knowledge Acquisition for ATE Diagnosis

  • Author

    Ryan, Patricia M. ; Wilkinson, A.Jesse

  • Author_Institution
    Teradyne, Inc., Woodland Hills, California
  • Volume
    1
  • Issue
    7
  • fYear
    1986
  • fDate
    7/1/1986 12:00:00 AM
  • Firstpage
    5
  • Lastpage
    12
  • Abstract
    An applied intelligence program for ATE fault diagnosis shows promise as an effective method to reduce mean time to repair (MTTR). The types of knowledge required by an intelligent diagnostic for VLSI test systems, the resources needed to derive that knowledge, the approach implemented to organize it, and the final form of the knowledge representations which resulted from our work are discussed in this paper.
  • Keywords
    Artificial intelligence; Circuit faults; Circuit testing; Databases; Fault diagnosis; Hardware; Humans; Knowledge acquisition; System testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/MAES.1986.5005153
  • Filename
    5005153
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=924808