Title :
Knowledge Acquisition for ATE Diagnosis
Author :
Ryan, Patricia M. ; Wilkinson, A.Jesse
Author_Institution :
Teradyne, Inc., Woodland Hills, California
fDate :
7/1/1986 12:00:00 AM
Abstract :
An applied intelligence program for ATE fault diagnosis shows promise as an effective method to reduce mean time to repair (MTTR). The types of knowledge required by an intelligent diagnostic for VLSI test systems, the resources needed to derive that knowledge, the approach implemented to organize it, and the final form of the knowledge representations which resulted from our work are discussed in this paper.
Keywords :
Artificial intelligence; Circuit faults; Circuit testing; Databases; Fault diagnosis; Hardware; Humans; Knowledge acquisition; System testing; Very large scale integration;
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
DOI :
10.1109/MAES.1986.5005153
