Title :
RF burnout dependence on variation in barrier capacitance of mixer diodes
Author_Institution :
Microwave Associates, Inc., Burlington, Mass.
Abstract :
A novel scheme to measure the VSWR and the "phase variation" of mixer diodes at high RF power levels is described. This experimental test system provides a nondestructive way of determining the power-handling capability of a mixer diode and also serves as an important tool in improving the burnout performance of point contact and Schottky barrier diodes.
Keywords :
Capacitance; Circuit testing; Counting circuits; Pulse amplifiers; Pulse modulation; Radio frequency; Schottky barriers; Schottky diodes; Switches; System testing;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1973.9017
