Modeling of microwave semiconductor devices using simulated annealing optimization

Author

Vai, Man-Kuan ; Prasad, Sheila ; Li, N.C. ; Kai, Francis

Author_Institution

Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA

Volume

36

Issue

4

fYear

1989

fDate

4/1/1989 12:00:00 AM

Firstpage

761

Lastpage

762

Abstract

A combinatorial optimization method is applied to the problem of device model optimization. A heuristic optimization technique called simulated annealing is applied to optimize the model parameters so that the device can be accurately simulated by the resulting model. This method avoids entrapment in the local minima of the objective function. Another application of this optimization process is to provide useful device parameters for a device process engineer. The effectiveness of this approach has been demonstrated by results from three test cases

Keywords

optimisation; semiconductor device models; solid-state microwave devices; combinatorial optimization method; device process engineer; entrapment; heuristic optimization technique; local minima; microwave semiconductor devices; objective function; simulated annealing optimization; Cost function; Curve fitting; Gradient methods; Microwave devices; Microwave theory and techniques; Optimization methods; Predictive models; Semiconductor devices; Simulated annealing; Testing;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.22482

Filename

22482