DocumentCode :
925864
Title :
A Time Domain Reflectometer Using a Semiautomatic Network Analyzer and the Fast Fourier Transform
Author :
Ulriksson, Bengt
Volume :
29
Issue :
2
fYear :
1981
fDate :
2/1/1981 12:00:00 AM
Firstpage :
172
Lastpage :
174
Abstract :
A time domain reflectometer system is simulated by measuring the reflection coefficient in the frequency domain and then computing the time domain signal by the Fourier transform. The program has been written for the Hewlett-Packard 8409A Semiautomatic Network Analyzer. The computation time has been minimized by using the fast Fourier transform. The problems imposed by the difficulty of switching the HP 8409A between low- and high-frequency ranges are also discussed.
Keywords :
Fast Fourier transforms; Fourier transforms; Gold; Integrated circuit technology; Nickel; Reflection; Skin; Spirals; Surface impedance; Time domain analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1981.1130318
Filename :
1130318
Link To Document :
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