• DocumentCode
    925864
  • Title

    A Time Domain Reflectometer Using a Semiautomatic Network Analyzer and the Fast Fourier Transform

  • Author

    Ulriksson, Bengt

  • Volume
    29
  • Issue
    2
  • fYear
    1981
  • fDate
    2/1/1981 12:00:00 AM
  • Firstpage
    172
  • Lastpage
    174
  • Abstract
    A time domain reflectometer system is simulated by measuring the reflection coefficient in the frequency domain and then computing the time domain signal by the Fourier transform. The program has been written for the Hewlett-Packard 8409A Semiautomatic Network Analyzer. The computation time has been minimized by using the fast Fourier transform. The problems imposed by the difficulty of switching the HP 8409A between low- and high-frequency ranges are also discussed.
  • Keywords
    Fast Fourier transforms; Fourier transforms; Gold; Integrated circuit technology; Nickel; Reflection; Skin; Spirals; Surface impedance; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1981.1130318
  • Filename
    1130318