DocumentCode
926248
Title
The Einstein relation
Author
Landsberg, P.T.
Volume
61
Issue
4
fYear
1973
fDate
4/1/1973 12:00:00 AM
Firstpage
476
Lastpage
476
Keywords
Aluminum alloys; Copper; Degradation; Electromigration; Inorganic materials; Integrated circuit metallization; Semiconductor films; Silicon alloys; Silicon devices; Temperature;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1973.9070
Filename
1451000
Link To Document