Title :
Two Simple Methods For The Measurement Of The Dielectric Permittivity Of Low-Loss Microstrip Substrates
fDate :
4/1/1981 12:00:00 AM
Abstract :
Two simple methods are presented for the measurement of the dielectric permittivity of low-loss microstrip substrates. The permittivity associated with a specific length of microstrip may be obtained. The methods are not wasteful of substrate material.
Keywords :
Conducting materials; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency; Impedance; Microstrip; Optimized production technology; Permittivity measurement; Transmission line measurements;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1981.1130362
