Title :
Influence of the charge pumping effect on an integrated solid-state image sensor using MOST switches
Author :
Tanigawa, Hiroshi ; Ando, Takao
Author_Institution :
Nippon Electric Company Ltd., Kawasaki, Japan
fDate :
4/1/1973 12:00:00 AM
Abstract :
The charge pumping in image sensors with MOST switches is simulated experimentally and discussed. It is found that photodiode potential is changed with no illumination, that photoelectric characteristics are degraded, and that a storage mode operation cannot be achieved. A desirable treatment available to diminish this effect is proposed.
Keywords :
Charge pumps; Differential equations; Frequency; Image sensors; Image storage; Integral equations; Photodiodes; Solid state circuits; Switches; System testing;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1973.9085
