• DocumentCode
    926399
  • Title

    Influence of the charge pumping effect on an integrated solid-state image sensor using MOST switches

  • Author

    Tanigawa, Hiroshi ; Ando, Takao

  • Author_Institution
    Nippon Electric Company Ltd., Kawasaki, Japan
  • Volume
    61
  • Issue
    4
  • fYear
    1973
  • fDate
    4/1/1973 12:00:00 AM
  • Firstpage
    491
  • Lastpage
    492
  • Abstract
    The charge pumping in image sensors with MOST switches is simulated experimentally and discussed. It is found that photodiode potential is changed with no illumination, that photoelectric characteristics are degraded, and that a storage mode operation cannot be achieved. A desirable treatment available to diminish this effect is proposed.
  • Keywords
    Charge pumps; Differential equations; Frequency; Image sensors; Image storage; Integral equations; Photodiodes; Solid state circuits; Switches; System testing;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1973.9085
  • Filename
    1451015
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=926399