DocumentCode :
926438
Title :
Separation of diffuse and specular components of surface reflection by use of polarization and statistical analysis of images
Author :
Umeyama, Shinji ; Godin, Guy
Author_Institution :
Neurosci. Inst., Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
Volume :
26
Issue :
5
fYear :
2004
fDate :
5/1/2004 12:00:00 AM
Firstpage :
639
Lastpage :
647
Abstract :
The image of an opaque object is created by observing the reflection of the light incident on its surface. The dichromatic reflection model describes the surface reflection as the sum of two components, diffuse and specular terms. The specular reflection component is usually strong in its intensity and polarized significantly compared to the diffuse components. On the other hand, the intensity of the diffuse component is weak and it tends to be unpolarized except near occluding contours. Thus, the observation of an object through a rotating polarizer approximately yields images containing constant diffuse component and specular component of different intensity. In this paper, we show that diffuse and specular components of surface reflection can be separated as two independent components when we apply independent component analysis to the images observed through a polarizer of different orientations. We give a separation simulation of artificial data and also give some separation results of real scenes.
Keywords :
image processing; independent component analysis; light polarisation; light reflection; dichromatic reflection model; diffuse components separation; image analysis; independent component analysis; light polarization; rotating polarizer; specular components separation; statistical analysis; surface reflection; Computer Society; Dielectrics; Independent component analysis; Layout; Light scattering; Light sources; Mutual information; Optical polarization; Optical reflection; Statistical analysis; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Diffusion; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Models, Biological; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Photometry; Principal Component Analysis; Reproducibility of Results; Scattering, Radiation; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Subtraction Technique;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2004.1273960
Filename :
1273960
Link To Document :
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