DocumentCode :
926498
Title :
Fused Impurity P-N-P Junction Transistors
Author :
Saby, John S.
Author_Institution :
Electronics Laboratory, General Electric Co., Syracuse, N.Y.
Volume :
40
Issue :
11
fYear :
1952
Firstpage :
1358
Lastpage :
1360
Abstract :
Fused impurity p-n-p junction transistors have been made which exhibit the useful circuit characteristics of high-gain, low-noise figure and alpha slightly less than unity. Such transistors are well adapted for application involving high ambient temperatures or high dissipation levels since alpha remains very nearly constant up to 120 degrees C and decreases somewhat above this temperature, permitting their stable use in emitter-grounded circuits at high temperatures. This is in contrast to junction transistors having high-resistivity collector regions, for which alpha often rises above unity at high temperatures leading to circuit instability. Satisfactory operation at several watts collector dissipation has been achieved.
Keywords :
Circuits; Fabrication; Germanium; Marine vehicles; P-n junctions; Power dissipation; Semiconductor device modeling; Semiconductor impurities; Signal processing; Temperature;
fLanguage :
English
Journal_Title :
Proceedings of the IRE
Publisher :
ieee
ISSN :
0096-8390
Type :
jour
DOI :
10.1109/JRPROC.1952.273962
Filename :
4050834
Link To Document :
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