DocumentCode
926620
Title
Measurement of Minority Carrier Lifetime in Germanium
Author
Valdes, L.B.
Author_Institution
Bell Telephone Laboratories, Murray Hill, N.J.
Volume
40
Issue
11
fYear
1952
Firstpage
1420
Lastpage
1423
Abstract
A method for measuring the lifetime of minority carriers in germanium is described. Basically, it consists of liberating the carriers optically on a flat face of a crystal and measuring the concentration of minority carriers as a function of distance from the point of liberation. The mathematical model is analyzed and experimental results are presented here.
Keywords
Charge carrier lifetime; Electrodes; Equations; Germanium; Laboratories; Length measurement; Mathematical model; Semiconductor materials; Surface treatment; Telephony;
fLanguage
English
Journal_Title
Proceedings of the IRE
Publisher
ieee
ISSN
0096-8390
Type
jour
DOI
10.1109/JRPROC.1952.273973
Filename
4050845
Link To Document