Title :
Measurement of Minority Carrier Lifetime in Germanium
Author_Institution :
Bell Telephone Laboratories, Murray Hill, N.J.
Abstract :
A method for measuring the lifetime of minority carriers in germanium is described. Basically, it consists of liberating the carriers optically on a flat face of a crystal and measuring the concentration of minority carriers as a function of distance from the point of liberation. The mathematical model is analyzed and experimental results are presented here.
Keywords :
Charge carrier lifetime; Electrodes; Equations; Germanium; Laboratories; Length measurement; Mathematical model; Semiconductor materials; Surface treatment; Telephony;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1952.273973
