• DocumentCode
    926641
  • Title

    Effect of Electrode Spacing on the Equivalent Base Resistance of Point-Contact Transistors

  • Author

    Valdes, L.B.

  • Author_Institution
    Bell Telephone Laboratories, Murray Hill, N.J.
  • Volume
    40
  • Issue
    11
  • fYear
    1952
  • Firstpage
    1429
  • Lastpage
    1434
  • Abstract
    A theoretical expression for the equivalent base resistance ¿b of point-contact transistors is derived here. This expression is shown to check experimental values reasonably well if the severity of some assumptions made for purposes of analysis is considered. Electrode spacing, germanium-slice thickness, and resistivity of the semiconductor are shown to be the properties that affect ¿b primarily.
  • Keywords
    Charge carrier lifetime; Conductivity; Contact resistance; Electric variables; Electrical resistance measurement; Electrodes; Equivalent circuits; Germanium; Surface resistance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1952.273975
  • Filename
    4050847