DocumentCode
926641
Title
Effect of Electrode Spacing on the Equivalent Base Resistance of Point-Contact Transistors
Author
Valdes, L.B.
Author_Institution
Bell Telephone Laboratories, Murray Hill, N.J.
Volume
40
Issue
11
fYear
1952
Firstpage
1429
Lastpage
1434
Abstract
A theoretical expression for the equivalent base resistance ¿b of point-contact transistors is derived here. This expression is shown to check experimental values reasonably well if the severity of some assumptions made for purposes of analysis is considered. Electrode spacing, germanium-slice thickness, and resistivity of the semiconductor are shown to be the properties that affect ¿b primarily.
Keywords
Charge carrier lifetime; Conductivity; Contact resistance; Electric variables; Electrical resistance measurement; Electrodes; Equivalent circuits; Germanium; Surface resistance; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IRE
Publisher
ieee
ISSN
0096-8390
Type
jour
DOI
10.1109/JRPROC.1952.273975
Filename
4050847
Link To Document